Soft Error Research*

The Pennsylvania State University

Soft Error Analysis Tool (SEAT)

Motivation

 

We plan to develop a community resource for researchers and industrial practitioners studying radiation-induced Single Event Effects (SEE) on computing systems. SEE is also called as soft error, as this is transient in nature. The proposed work will result in the creation of an accelerated soft error testing dataset and development of SEAT, a Soft Error Analysis Tool set drawn on the combined expertise of computer and nuclear engineers. The uniqueness of the tool set will be the support for soft error analysis ranging from device to architectural level. The design and validation of this tool set will be supported by accelerated soft error testing performed at the Breazeale nuclear research reactor at the Penn State campus. The data generated from our soft error testing and SEAT will serve as vital resources for researchers in developing and evaluating soft error countermeasures.

 

 

Website maintained by

 

Ramakrishnan Krishnan

OUTLINE

 The purposed tool supports soft error analysis at device level (SEAT-DA), circuit level (SEAT-CA), logic level (SEAT-LA) and architecture level (SEAT-AA). The tool creates library of abstractions to serve as an interface between the different levels used for analysis.

DOWNLOADS

SEAT—DA—Soft Error Analysis Tool—Device Analyzer

SEAT-LA-Soft Error Analysis Tool-Logic Analyzer

* This work is supported in part by NSF Award # 0454123