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RAS Papers 2004

CSE MDL Reliable Circuits and Systems papers of 2004

  • K. Unlu, V. Degalahal, M. S. Cetiner, N. Vijaykrishnan, M. J. Irwin, Testing Neutron-Included Soft Errors in Semiconductors, Proc. of the American Nuclear Society Winter Meeting, pp. 825-826, Nov. 2004.
  • B. Kang, N. Vijaykrishnan, M. J. Irwin, Analyzing Software Influences on Substrate Noise: An ADC Perspective, Proc. of ICCAD’04, pp. 916-922, Nov. 2004.
  • S. Srinivasan, A. Gayasen, N. Vijaykrishnan, M. Kandemir, Y. Xie, M. J. Irwin, Improving Soft-error Tolerance of FPGA Configuration Bits, Proc. of ICCAD’04, pp. 107-110, Nov. 2004.
  • Y. Xie, L. Li, M. Kandemir, N. Vijaykrishnan, M. J. Irwin, Reliability-aware Cosynthesis for Embedded Systems, Proc. of ASAP'04, pp. 41-50, Sep. 2004.
  • G. Chen, M. Kandemir, N. Vijaykrishnan, A. Sivasubramaniam, M. J. Irwin, Analyzing Heap Error Behavior in Embedded JVM Environments, Proc. of the Conf. on Hardware/Software Codesign and Systems Synthesis (CODES+ISSS'04), pp. 230-235, Sep. 2004.
  • L. Li, V. Degalahal, N. Vijaykrishnan, M. Kandemir, M. J. Irwin, Soft Error and Energy Consumption Interactions: A Data Cache Perspective, Proc. of ISLPED’04, pp. 132-137, Aug. 2004.
  • V. Degalahal, R. Rajaram, N. Vijaykrishan, Y. Xie , M. J Irwin, The Effect of Threshold Voltages on Soft Error Rates, Proc. of ISQED’04, pp. 503-508, March 2004. slides.pdf
  • M. Pirreti, M., G. Link, R. Brooks, N. Vijaykrishnan, M. Kandemir, M. J. Irwin, Fault-tolerant Algorithms for Network-on-chip Interconnect, Proc. of ISVLSI’04, pp. 46-51, Feb 2004.
  • L. Li, N. Vijaykrishnan, M. Kandemir, M. J. Irwin, A Crosstalk Aware Interconnect with Variable Cycle Transmission, Proc. of DATE'04, pp. 102-107, Feb 2004. slides.pdf
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